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- Taylor Dynamometer, Inc.
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Dynamometer Controls, Data Acquisition Systems and Instrumentation
Whether you want a basic engine dynamometer configuration that provides torque, rpm and power or need an advanced, full-featured test and measurement software package, Taylor has a data acquisition system that will serve your unique application without breaking your budget. Contact Taylor to discuss which instrumentation system and related accessories are right for you, and turn your testing challenges into success.
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Thyratrons and Accessories
Cargo scanning is a broad term which encompasses intelligent logistics, sniffer dogs and X-ray inspection. X-ray inspection systems offer rapid, non-invasive checking of manifests, detection of contraband, and when combined with other techniques, can be used to identify the presence of nuclear material. X-ray energies up to 10 MeV are required to penetrate fully loaded shipping containers and vehicles. These X-rays are generated through the acceleration of electrons along a linear accelerator into a target using megawatt energy microwave pulses produced by the RF sub-system.The skills for the design, manufacture and integration of specialised components for low-cost systems reside mainly in commercial companies. There is an emerging trend for linac system companies to demand higher performance from their integrated RF sub-systems.Currently, we intend not only to drive the innovation and development in this area, but also to offer integrated RF sub-systems to meet new requirements such as, portability, material discrimination and higher throughput.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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Coating thickness XRF Standards
We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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X-ray Inspection System
TruView™ Simplex
We created the SimpleX because sometimes all we need is a simple and easy to use X-ray machine to take X-ray images. TruView™ SimpleX: as simple as it gets.
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X-Ray Systems
X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
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Cabinet X-ray System
XPERT 80- L
Kubtec's XPERT 80-L, for large area imaging, is a multi-purpose cabinet x-ray system bringing high quality medical-grade imaging and ease of use to applications in scientific research, pathology and industry. A small focal spot with an x-ray source of up to 130 kV offers brighter images with higher contrast for visibility of the smallest details and most subtle variations in density. Optional sources are available for micro-focus and soft x-ray applications.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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In Vivo Imaging
Introducing two NEW systems in the IVIS® Lumina™ preclinical in vivo imaging instrument family, the IVIS Lumina S5 and the Lumina X5. The IVIS Lumina S5 2D optical imaging system combines high sensitivity optical and patented spectral unmixing capabilities in a high-throughput system. The IVIS Lumina X5 has all the features of the S5 with integrated high-resolution x-ray.
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High Resolution Inline AXI Platform
AXI XS Series
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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X-Ray Inspection System
TruView™ Fusion
The quality of your products is paramount to the success of your business. The TruView™ Fusion X-ray Inspection System allows you to "see inside" your products without destroying them, enabling unprecedented understanding of your manufacturing process. The TruView™ Fusion X-ray is the right solution if you are looking for a radiography system to inspect medical devices, printed circuit boards, electronic components, and mechanical parts.
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Industrial CT X-Ray Inspection System
X5000
The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
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Handheld X-Ray Backscatter Imaging System
Nighthawk™
Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
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Control Unit for SITEx & SITExs
SITEX SCU286
The SCU286 has a system for direct measurement of the high voltage delivered by the X-Ray generator to guarantee the accuracy of the radiological parameters. Based on this data the control system maintains the stability of mA and kilovolts to within ± 0.5% in any selection range.SITEX & XS units offer a totally constant quality of exposures, as they are virtually exempt from fluctuations in the power supply.
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Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
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Digital X-ray Detector
Aurora
Aurora is a product family of digital X-ray detector solutions powering all security and a variety of industrial line-scanners. The product family consists of a wide range of stand-alone detectors, and all needed building blocks, like ready-made detector boards, modules and readout electronics, for end-to-end systems. Aurora provides superior image quality and a fully digitalized data path in the most robust, modular and easily scalable platform. It is a plug-and-play type solution speeding up time-to-market and delivering total cost savings.
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Benchtop X-ray Diffractometer
Aeris
Meet Aeris – our brand-new benchtop X-ray diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a Malvern Panalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.
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Real Time X-Ray Imaging
GO-SCAN C-VIEW
Go-Scan C-view is a light weight ruggedized real time X-ray imaging system specifically designed for hand-held inspection such, among other, Corrosion Under Insulation (CUI) inspection. It includes a high speed and high resolution CMOS imager and a battery-operated 70kV x-ray tube designed for portable field operation. The video imaging system captures images and displays them on a hand held display in real-time.
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LIXI ImageScope
The LIXI ImageScope is an open system commercial industrial xray scanning tool. Lightweight and portable, its design is ideal for quick, onsite results.
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Rack-Mount Power Supplies
Explore rack-mount high voltage power supplies that feature IGBT switch mode technology or active power factor correction. And check out our rack-mount modules equipped with disc sets, which are ideal for ion-beam and electron-beam systems and X-ray equipment. Choose from standard modules or customize.
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Electron Probe Microanalyzer
EPMA-8050G
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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TEL-X-Ometer X-ray System
X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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Ultra High Performance 3D CT System
UltraTom
3D micro-tomography (CT Scan) and nano-tomography. Modular system with multiple imagers and x-ray generators. Experimentations possible in-situ. Large volume Inspection and manipulation volume.
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably. X-ray systems from Viscom are used for the inspection of series assemblies as well as sampling and prototype controls. They take care of typical inspection tasks in concealed areas such as void controls, THT filling level measurements, and HIP inspections. At the same time, the systems reliably determine defect features such as coplanarity and polarity – at high inspection speeds and in a cost-effective way.
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High Speed Inline AXI Platform
AXI X Series
The X-platform series is a dedicated high speed inline automated X-ray inspection system for the inspection of PCB-assembly boards for single/multipanels or samples in trays. The system offers market leading inspection speed and is ideal for low-mix high-volume production environment.
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3D X-ray hybrid inspection system
YSi-X
Ideal for 100% inspection of onboard automotive products and many other items by 3D X-rays acquire layered of target. X-ray, optical, infrared, and laser height measurement as standard equipment; hybrid and high reliability with multiple inspection modes.
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X-Scan U
X-Scan U series based on the novel digital platform improves image quality, increases maximum scanning speed and saves the overall system cost of industrial in-line and off-line nondestructive testing (NDT) of tires. X-Scan U series is an enhanced product family of U-shaped X-ray line cameras developed and optimized specially for high-speed digital tire inspection utilizing panoramic X-ray sources.
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Real-time X-ray Inspection System
JewelBox 70T™
The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system’s 10-micron MicroTech™ x-ray source provides magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
