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- Pickering Interfaces Inc.
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Modular Breakout System 78-Pin D-type Plugin Module
95-200-001
The 95-200-001 Plugin Breakout Module is designed to be fitted to a PXI 40-200 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Multifunction Switch / Measure Unit, Modules
34980A Series
The Keysight 34980A multifunction switch / measure mainframe and modules provide functionality that is easy to set up and use. The 34980A helps you lower your cost of test and accelerate your test system integration and development.
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Functional Testing
Interface Testingevaluation of correct system module interaction Smoke Testinginitial testing process to check whether software is ready for further testingSystem Testingconducted on a complete, integrated system to evaluate the system's compliance with its specified requirements Integration Testingperformed to test units of code to verify interaction between various software components and detect interface defectsRegression Testingtesting to ensure changes made are not impacting previously working functionality Acceptance Testingperformed to make sure the software handles required tasks in real-world scenarios, according to specifications
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Modulation Distortion Up To And Beyond 125 GHz
S930713B
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Flexible Test Environments and Integration Services for your Integrated System Tests
TESTERLYZER® Frame 4.0
The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.
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SoftTest Design Testing Services
We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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DC Power Supply
62000H
Chroma Systems Solutions, Inc.
Chroma’s new 62000H Series of programmable DC Power Supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include a high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals, as well as the ability to create complex DC transients waveforms to test device behavior to spikes, drops, and other voltage deviations. For high power applications, parallel up to 10 units for up to 150kW.
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Dynamometer Test Systems
Genuen provides a full range of off-the-shelf and custom dyno test cell solutions. We offer turnkey test cell integration services and test cell upgrades and modernization for all types of dynamometers used in automotive, aerospace, industrial, commercial, off-highway, and agricultural markets. Our broad-based expertise includes dynamometer test systems ranging from AC motor, hydrokinetic, hydrostatic, electric AC/DC, eddy current, and hysteresis brake.
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DC Blocks
BroadWave designs and manufactures DC Blocks and other coaxial RF components that are ideally suited for test, verification and system integration. With frequency ranges of DC to 18 GHz, our components offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Proven Testing Solutions for Critical Software
V&V Services
*Unit and integration testing*System and acceptance testing*DO-178 process definition and optimization*Test automation*Timing analysis and optimization*On-target problem solving*Third-party software verification*Assurance services
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Data Acquisition Systems & Data Loggers
Whether it’s in a vehicle, on a test stand or monitoring equipment and machinery - imc data acquisition systems are easy to operate and will help you become more productive and profitable. Our products are suited for work in mechanical and mechatronic applications. They handle up to 100 kHz per channel, are compatible with almost all signal sources and sensors, and can measure nearly all physical quantities such as pressure, force, speed, vibration, noise, temperature, voltage and current. The spectrum of imc data acquisition systems ranges from simple data acquisition via integrated real-time calculations, to the integration of models and complete automation of test stands.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Wide Range High Voltage Programmable DC Power Supply
N3600 Series
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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Signal Integration Systems
Avenue
The Avenue system includes modules for video up/down conversion, audio embedding, synchronization, conversion, routing, noise reduction, protection switches, test signal generators and more. Avenue signal processing modules are used worldwide in broadcast, mobile, satellite, cable, worship and post production facilities. Avenue is a tray-based signal integration system housed in a 1RU or 3RU frame. Any combination of 1.5 Gb/s HD, 3 Gb/s HD, SD, MPEG, analog video and audio processing modules can be used together in the same frame.
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MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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VeriStand
VeriStand helps you get your hardware-in-the-loop or test cell control and monitoring system up and running quickly. With a wide range of out-of-the-box functionality that includes configurable data acquisition and logging, test sequencing, and simulation model integration, VeriStand reduces the time needed to test your products. You can also use a variety of software tools to add custom functionality to VeriStand, which makes it flexible enough to adapt to even the most complex applications. Choosing VeriStand gives you the confidence that your test system will perform reliably while providing the flexibility you need to meet your real-time test requirements.
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ARINC 429 Bus Interfaces
AIM’s > ARINC 429 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O.
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4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Custom Test Stands/Production Test Cells
Emprise Corporation is an engineering consulting firm serving the automotive, aerospace, industrial and alternate power industries. Our expertise in each of the individual fields of technology, systems integration, construction management, and integrated test facility design and delivery sets Emprise apart from other single-source engineering firms.
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Solar Simulators
TriSOL CPV
Concentrating Photovoltaics (CPV) has the promise of producing solar cells with high cell efficiencies, which result in a reduction in the cost of operating a PV module. However, a CPV system requires the integration of CPV solar cells, modules and CPV optics into one efficient system. OAI’s focus is CPV cell testing methodology. The CPV cells can now be tested using OAI’s advanced standalone CPV Simulators for low dose and high dose configurations. The low dose CPV Solar Simulator provides exposure up to 50 Suns, whereas, the high dose CPV Solar Simulator provides exposure up to 1500 Suns. The low and high dose simulators provide exposure in varying Sun concentrations in various beam sizes from 1.5cm x 1.5cm to 7.5cm x 7.5cm, and may be configured with OAI’s I-V Test Systems.
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Optical Signal Test Set
OST
The Optical Signal Test Set (OSTS) combines a state of the art optical power meter, a variable attenuator, and a high stability laser source. The unit is able to measure optical signals below -100dBm with 0.001dB resolution at a fraction of the size, power, and cost of competing solutions. Other features include data logging, programmable filtering, and auto calibration. Its small shielded ruggedized package, USB/power interface, and low cost make this unit perfect for lab use or for integration into larger systems.
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Integrated Transformer Test Van
XD90
Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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Software & Hardware Interface
XJAPI
The XJAPI is a simple-to-use DLL Application Program Interface (API), designed to give you low-level access to the JTAG chain via either the XJLink or the PXI hardware, allowing easy integration with a wide range of other systems such as development/evaluation boards, test systems
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USB Modular Products Chassis
U2781A
The Keysight U2781A USB modular instrument chassis is a high-performance 4U high chassis that comes with a 200 W universal AC power supply and a built-in protection circuit. This portable chassis can house up to six Keysight USB modular products. The U2781A targets a wide range of applications in both industrial and scientific environments in the research and development (R&D), design-validation, and manufacturing fields. The primary advantage of this chassis is its synchronization capability between modules. This can help you to lower your cost of testing and accelerate your test system integration and development.
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Duplex Double Test Insertion/Return Loss Test Station
JW8302
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW8302 Duplex double test Insertion/Return Loss Test Station is a professional equipment to test CWDM device, multi-wavelength device, PLC, fiber optical patch cord and other passive optical devices. It is a new-generation precision optical instrument of JOINWIT who combined with so many years experience in optical passive detection. It equipped with VFL or 850 light source , supporting threshold determination, automatic multi-wavelength detection, system integration, secondary development, upper computer solution, etc. Double LC interface or other different interfaces can be tested simultaneously which is convenient for testing and improves efficiency; The VFL function could automatic on and off, no need to replace the connector.
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Engine Test Adapters
Atec has built test adapters for a wide variety of engines from high bypass fan engines to small APU engines. Testing a new engine type in your existing jet engine test cell can be challenging, and upgrade modifications will be needed. Atec does not view an adapter as just a mechanical weldment that simply mates the engine to the aeroengine thrust stand. Our engineers realize that additional items will be needed in the facility to insure total project success. During the planning phase, Atec engineers can visit your existing facility and/or review videos to make a comprehensive assessment of the integration needed to add a new engine type to your testing facility. Atec can perform airflow, acoustics, FEA and sub systems analyses to ensure that any new engine added to your jet engine test cell will have the proper capacity to perform properly. Vital Link’s current experience with advanced fighter engines test adapter kits further bolsters our expertise in high thrust engine test handling.
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Functional Testing for Developers
TestLeft
TestLeft is a powerful yet lean functional testing tool for dev-testers working in Agile teams. It fully embeds into standard development IDEs. A built-in access to object and method library is also available with TestLeft. Dev-testers can thereby easily and quickly create robust functional automated tests without leaving their favorite IDEs such as Visual Studio. It also works well with other tools in dev eco-systems such as source control or continuous integration systems.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
