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- Pickering Interfaces Inc.
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Surface Mount Reed Relays from Pickering Electronics
Pickering Electronics Surface Mount Reed Relays contain the highest quality instrumentation grade reed switches making them suitable for the most demanding applications and are suitable for infra-red or vapor phase reflow soldering.
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Ocean Observer III
Teledyne Marine RD Instruments
Since 1997 Teledyne RD Instruments has been providing ADCPs that have proven in the field they can profile beyond 1000 m from research vessels traveling at speeds >15 knots and from offshore oil and gas platforms during exploration work. That same technology has now allowed us to create the Ocean Observer III 38 kHz ADCP. We have combined our field-proven 38 kHz phased array ADCP transducer with our field-proven electronics into a single package that is capable of profiling >1000m. This design makes it ideal to be mounted from an oil platform, over the side of a vessel, and in surface buoys.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Process RF Analyzer
IMPS-4400
The Sensortech Instant Moisture Profiling System (IMPS-4400) is a non-contact RF moisture profiling system for board manufacturers to improve and optimize production processes and meet quality standards, reduce energy costs, increase productivity, and generate revenue. The IMPS-4400 utilizes radio frequency antennas to analyze board moisture characteristics below the surface, which is critical information to ensure consistent quality of finished boards.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Profiling Belt Radiometer
ILT400
International Light Technologies
The IL400 Profiling Belt Radiometer continues with the all-in-one exposure, intensity, and profiling capability first introduced in the IL393. New solid-state detector and ultra-stable amplifier technology along with rechargability combine to give lower noise, greater speed, and higher accuracy at a price below any precision belt radiometer sold today.
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Profiling Systems
ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Observational Systems: Profiling Floats
Autonomous profiling floats are revolutionizing the way scientists study the ocean. Before the first profiling float entered the water, our ability to measure climate, biological, and chemical trends was limited in scope while large-scale studies were a costly endeavor.
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Rapid Profiling
MIDAS SVP
Suitable for rapid profiling down to 6000m depth, the MIDAS SVP gives the most accurate Sound Velocity Profiles currently possible.
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ElcoMaster Oven Profiling Software
*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
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Sub-bottom Profiling
The EdgeTech Sub-bottom Profiling System is a wideband Frequency Modulated (FM) sub-bottom profiler utilizing EdgeTech’s proprietary Full Spectrum CHIRP technology. The systems generate high-resolution images of the sub-bottom stratigraphy in oceans, lakes, and rivers.
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Surface Thermography
Advanced Thermal Solutions, Inc.
Liquid Crystal & Surface Thermography Systems for Temperature Mapping Studies.
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CTDs: Profiling
Profiling CTDs make continuous measurements as they travel through water. When lowered over the side of a ship or integrated with an autonomous vehicle, they map a vertical column of water's characteristics. Compared to moored CTDs, profiling CTDs account for dynamic errors introduced by moving through water and sample rapidly to generate a high-resolution dataset over a short period of time. Sea-Bird Scientific profiling CTDs are:*Designed to perform under unique dynamic conditions found on moving platforms.*Pumped and ducted for constant flow to match temperature and conductivity response.*Plumbed so measurements are made on the same sample of water with a predictable delay and predictable flow effects.*Built with a rugged design for shipboard and autonomous deployments.
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Surface Measurement Instrument
SMI
Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
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Surface Thermometers
Tel-Tru® Manufacturing Company
Tel-Tru Surface Thermometers are designed to measure surface temperatures on a wide variety of surfaces and are available in several configurations.
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Guardian HD Web Profiling Series
Accurate moisture, coat weight and film thickness profile measurement for process control in paper and film converting applications.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Surface Cleanliness
Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Surface Plasmon Resonance Analysis
Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Surface Profile Gauge
123
The Elcometer 123 Surface Profile Gauge is an easy to use analogue gauge which measures the peak-to-valley height of a blast cleaned surface in a similar way to the Elcometer 224 Digital Surface Profile Gauge.
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Surface Profile Gages
PosiTector® SPG
Surface Profile Gages for Blasted Steel, Textured Coatings and Concrete Profile. Digital depth micrometer measures and records peak to valley surface profile heights.
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Surface Roughness Meter
Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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Chemical Analysis + Surface Analysis
Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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K Thermocouple Surface Probe
TP772
Surface thermocouple Type "K" probe. °C max: 400. Response time: 3 s.
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K Thermocouple Surface Probe
TP745
Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Analog Surface Profile Gauge
NOVOTEST LIMIT
Mechanical depth gauge is designed to comply with ASTM D 4417-B, SANS 5772, US Navy NSI 009-32, US Navy PPI 63101-000 for (depending on configuration): measures the peak-to-valley height of a blast cleaned surface; measurement the depth of focal corrosion; measures depth of narrow holes and grooves.
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Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
