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Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
- Pickering Interfaces Inc.
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PXI Switched Guard Reed Relay Module, 16x 2:1 Multiplexer
40-121-011
The 40-121-011 provides 16x 2:1 multiplexers in a single slot PXI module and designed to provide an isolation resistance in excess of 1013Ω. It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test.
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SmartPower® Microwave Power Generators
AX2500
SmartPower® AX2500 Series intelligent microwave power generators build on ASTeX's experience in producing rugged, reliable microwave power generators for demanding semiconductor fabrication and industrial applications. The AX2500 design architecture incorporates the best of ASTeX field-proven technology, and combines new design features aimed at improved performance and lower cost of ownership.
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Quantum Cascade Laser Sensors
QCL sensors use mid-infrared semiconductor laser sources, either intraband Quantum Cascade Lasers or Interband Cascade Lasers to enable high precision, high accuracy, and selective detection of trace gases such as greenhouse gases and chemical agents with application to a variety of commercial, industrial, defense and environmental problems.
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Platform
yieldHUB
yieldHUB is fast, scalable and comprehensive. Leading fabless and IDM semiconductor companies choose yieldHUB.
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RF/MW Generators
Daihen Advanced Component, Inc.
Technical innovations such as miniaturization and three-dimensional applications are continuously happening in the field of semiconductors for making them more compact and packing more functionalities in them. “AVANCER” is a highly reliable (RF)power generator(s) brand equipped with various functions required by the next generation of semiconductor manufacturing processes, such as pulsed RF output and power saving. With proven technology and reliability, it contributes to the future of the ever evolving semiconductor industry.
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High Temperature Digital Mass Flow Controller
SEC-8000 F/D/E Series
The SEC-8000F/D/E series can operate in high temperature environments, from 15 ℃ to 120 ℃, for a variety of tasks including semiconductor and compound semiconductor processing.
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64-Axis PCIe EtherCAT Master Motion Controller
PCIe-8338
ADLINK PCIe-8338 is a hardware-based EtherCAT motion controller able to support up to 64 synchronized axes and over 10,000 points simultaneously. The PCIe-8338 features dedicated isolated emergency stop input (EMG), and configurable isolated high-speed digital input as not only generic sensor input but also pulsar input, with up to 1MHz input frequency. Optimum jitter control is provided in minimal cycles of 250µs to optimize synchronous I/O performance for vertical automation applications in semiconductor, electronic manufacturing, and others. The PCIe-8338 provides an out-of-shell application-ready (APS) function library to generate multi-dimensional, highly synchronized, time-deterministic event-triggered motion & I/O control. A wide range of compatible 3rd party slaves are easily designed with ADLINK's APS function library. ADLINK's MotionCreatorPro 2 utility is fully compliant with the Microsoft Windows environment, that allows complete EtherCAT motion and I/O configuration and function evaluation as well as compiling program download functions.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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High-resolution, SWIR megapixel camera
Wildcat+ 1280 Series
The Wildcat+ 1280 series is based upon a state-of-the-art InGaAs photodiode array with 1280×1024 pixels and 5 μm pixel pitch. The camera offers superior, high-resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 1280 camera outputs full frame images at 120 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 1280 is suitable for semiconductor inspection, display inspection (mobile phone and TV), microscopy and laser beam analysis.Benefits & Features• Compact and industry-proven camera design• High-resolution SWIR imaging• Advanced on-board image processing performance• GenlCam compliant• Flexible optical mount and lens options
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Wafer Analysis Systems
Tropel®
Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Radiation Detectors
High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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PXI-5670, 2.7 GHz PXI Vector Signal Generator
PXI-5670 / 778768-01
2.7 GHz PXI Vector Signal Generator—The PXI‑5670 has the power and flexibility you need for product development applications from design through manufacturing. It can generate custom and standard modulation formats such as AM, FM, PM, ASK, FSK, PSK, MSK, and QAM. The PXI‑5670 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as for emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks.
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Metrology Systems
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Device Modeling Products
Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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Engineered Systems
AMETEK Programmable Power, Inc.
When a catalog product cannot completely satisfy a requirement, AMETEK Programmable Power's Solutions Business provides custom power supply systems and integrations. The solutions range from OEM integration for medical and semiconductor industries to modular avionics ATE power subsystems to turnkey solar array simulators for satellites. We also can modify power supplies to meet your application requirements.
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13MP 4K Camera Module
e-CAM131_CUMI1335_MOD
e-CAM131_CUMI1335_MOD is a high performance, 13 MP 4K camera module with S-Mount lens holder and it has better low light performance. This small form factor 4K camera module is based on 1/3.2” AR1335 CMOS image sensor from ON Semiconductor® and has a dedicated, high-performance Image Signal Processor (ISP) that performs the entire Auto functions like auto white balance, auto exposure control in addition to complete image signal processing pipeline that provides best-in-class images and video and the optional MJPEG compression.
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Meters For Contact Angle And Surface Tension + Semiconductor Technology, Micro Scriber
SURFTENS HL Automatic
Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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50MHz Arbitrary Waveform/ Function Generator
Model 645
Berkeley Nucleonics Corporation
The BNC Model 645 50MHz Function/Arbitrary Waveform Generator delivers many advanced features and user modes than our previous models, with a price that is designed to meet tough economic constraints. New DDS+ technology embraces advancements in the semiconductor industry and leverages state-of-the-art components for both standard and complex functions. The resulting design is a box for every bench, far more capable than the ARBs and Function Generators of the past. We have even incorporated IP support, so a web browser can control the instrument over LAN.
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Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN
Optik Elektronik Gerätetechnik GmbH
Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
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DSP-Based 4/8-Axis Advanced Pulse-Train Motion Controllers
AMP-204C/AMP-208C
ADLINK"s new AMP-204C/AMP-208C DSP-based 4/8-axis advanced pulse-train motion controllers incorporate up-to-date floating-point DSP and FPGA technology, enabling high pulse output and encoder input frequency up to 6.5 MHz and 20 MHz respectively. Leveraging ADLINK" s Softmotion technology, the AMP-204C/AMP-208C offer impressive comprehensive and application-oriented motion functionality to reduce development time while maintaining superior throughput and accuracy. Superior synchronous motion control performance combines with point-table function integrating multi-dimensional interpolation, such as 3D linear/circular/spiral interpolation with enhanced trajectory and velocity planning, for contouring applications in semiconductor, display and conventional manufacturing industries. The AMP-204C/AMP-208C also support PWM control with three different control modes for frequency or duty cycle, benefiting laser engraving/marking/cutting applications. Moreover, hardware-based position comparison and trigger output are applicable in AOI applications.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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0 Hz/DC to 14 GHz, Single-Pole, Four-Throw MEMS Switch With Integrated Driver
ADGM1304
The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications. An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable. The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).
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5.0 MP NVIDIA® Jetson Xavier™ NX/NVIDIA® Jetson Nano™ Camera
E-CAM50_CUNX
e-CAM50_CUNX is a 5.0 MP MIPI CSI-2 fixed focus color camera for NVIDIA® Jetson Xavier™ NX/NVIDIA® Jetson Nano™ developer Kit. This camera is based on 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® with built-in Image Signal Processor (ISP). This powerful ISP helps to brings out the best image quality from the sensor and making it ideal for next generation of AI devices.
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Mercury Probes
Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
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Rad Hard GaN FETs
Wide band gap semiconductor technologies such as Gallim Nitride Field Effect Transistors (GaN FETs) have been gaining interest for power management and conversion in space applications. These devices feature higher breakdown voltage, lower RDS(ON) and very low gate charge enabling power management systems to operate at higher switching frequencies while still achieving higher efficiency and a smaller solution footprint. There is an additional benefit from GaN devices that make them attractive to the space market. These devices are inherently immune to total ionizing dose radiation.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Metrology
Optical critical dimension (OCD) metrology and film metrology require accuracy and repeatability. Onto Innovation's techniques are well-established and trusted by semiconductor manufacturers around the globe.
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
