Filter Results By:
Products
Applications
Manufacturers
- Virginia Panel Corporation
product
i1 XL (High Power)
Ideal for high amperage applications. Single module offers 4 high power contacts in one connector. Removable backshell allows easy access to wiring for maintenance and probing.
-
product
Digital Display Auto Circuit Tester
1676
Peaceful Thriving Enterprise Co Ltd
This is a DC voltage tester with smart over-voltage protection and warning for vehicle repair. As electrical system for vehicle becomes more complex, the tester is able to test voltage value, identify DC polarity from different background light color, positive / negative sign, and over-voltage level indication. Moreover, the special designed probe is able to help user to hook, piercing, and probing the wires.
-
product
Probing Machines
Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
-
product
Fixture and Software for Open/Leak Inspection
In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC-READ provides specialized software for test point selection and log analysis.
-
product
Starter Probe Station
C Series
Contains fundamental features to probing. C series lets you kick off your experiments and is an entry level machine designed for ease of use while allowing you to get accurate, reliable results.
-
product
Passive Probes
Passive voltage probes ship standard with most oscilloscopes and provide a low cost, general purpose probing solution. Generally, these probes lack the performance of an active voltage probe but provide the ruggedness and wide dynamic range suitable for visualizing signals over a broad range of applications. Tektronix has released a new class of passive probes that redefine performance in the passive probe product category.
-
product
30 GHz Differential Probe with 2.92mm Interface
DH30-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
TTL/I2C/SPI* Expansion Kit
OP-SB5GL
OP-SB5GL is the interface expansion kit that has a port to measure RS-232C(V.24) and a port to measure the TTL / CMOS signal level communications. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communications between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI* on monitoring and simulating.
-
product
WaveMaster Oscilloscope, 8 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 808Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
-
product
Mercury Probes
Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
-
product
13 GHz Differential Probe with ProLink Interface
DH13-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
Cryogenic Probe Station
CPX-VF
The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.
-
product
DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
Serial Probes
Probing a SRIO 1 or 2 serial bus at the transmit or receive end point provides the optimal signal for analysis. Single channel probes are designed to attach at that point providing flexibility for different channel widths.
-
product
Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
-
product
Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
-
product
High Frequency/Microwave
SemiProbe high frequency probing solutions provide a broad array of capabilities for measurements ranging from DC to over 300 GHz. We design PS4L systems for high frequency applications with carefully selected components including chucks, probe arms, probes, cables, tuner modules, and calibration suites that are optimized for the frequency range that the application will operate in.
-
product
Stack Probing Sensor
L722
The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
-
product
Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
-
product
Static and dynamic analysis
MEMS
Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
-
product
Automotive Back Probe Pins
142-5
Flexible 1.5 inch silicon pins provide easy back probing connections for DMM and Scope measurements
-
product
Passive Probe, 500 MHz, 2.5mm Tip
PP007-WR-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
-
product
Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
-
product
Microwave Testing
40A
The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
-
product
ITA, I1 XL, 1 Module, Extra-Large Cable Exit
410128106
The i1 XL offers an extra-large cable exit that can hold cable bundles with a bushing effective diameter of 1.26" . A slide-off backshell allows easy access to wiring for maintenance and probing. Most commonly used in high-power applications with VPC's high power modules and patchcords. Includes protective cover (not pictured).
-
product
Vibration Isolation Tables
Probing Solutions offers Vibration isolation tables made by Kinetics and TMC. To order a table, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
-
product
DH Series QuickLink Adapter, 8 GHz BW
DH-QL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
-
product
High Voltage Passive Probes
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
-
product
Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
-
product
Semi-Automatic LCD Probe Station/Laser Repair System
LCD 2424
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
-
product
Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
