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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
- Pickering Interfaces Inc.
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Modular Breakout System 50-Pin D-type Plugin Module for 40-198
95-198-001
The 95-198-001 Plugin Breakout Module is designed to be fitted to a PXI 40-198 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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GSP-2B Test System Interface Probe
GSP-2B
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Digital Display Auto Circuit Tester
1676
Peaceful Thriving Enterprise Co Ltd
This is a DC voltage tester with smart over-voltage protection and warning for vehicle repair. As electrical system for vehicle becomes more complex, the tester is able to test voltage value, identify DC polarity from different background light color, positive / negative sign, and over-voltage level indication. Moreover, the special designed probe is able to help user to hook, piercing, and probing the wires.
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EMCTD Broadband RF Safety Systems
The EMCTD analog Smart Fieldmeter® is easy to read and to operate. The EMCTD broadband electromagnetic probe covers the 0.2 to 3000 MHz spectrum where most common industrial, communications, medical and government RF emitters are found. The ANGPE-3000 system enables checking of home, office, and workplace RF levels. The system is designed to conveniently measure RF levels around WiFi access points, RFID systems and rooftop antennas; to find transmitter cabinet radiation, locate transmission line leaks, to identify non-radiating antenna elements, and much more. With the supplied NIST-traceable calibration, this system supports laboratory testing of RF devices in compliance with present EMC and RF safety standards.
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500Mz Tracing Signal Genrator
SM-5006
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Probes & Flow Cells
The sample interface is a virtual “windows into the process” and is a critical component of any optical analyzer system. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV/Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal transmission for long-term reliable measurements.
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Criticality Systems
The CAAS-3S is a next generation system based on operational excellence established over forty years. The new design is based on the highly reliable analog signal chain used in the probe design for the previous EDAC-2 and later EDAC-21 products which have had successful safety records and very low false alarm rates. This new system addresses the next several decades of facility operation.
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Bridge Coordinate Measuring Machines
Measurement results with high accuracy are particularly important for quality assurance. Bridge coordinate measuring machines from ZEISS have a precise probe system that convinces with high measuring speed. The various solutions and systems can be tailored directly to individual requirements.
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Sensor Products: Weld Force Probe Auditing System
90061-XH Series
This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders. The system consists of a handheld sensor and portable readout/ data logger (PMAC 2000).
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Metrology Systems
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Concrete Strength Testers
This category of products comprises the range of instruments utilized to evaluate construction material strength. The range of instruments is typically considered to be two parts. The first are non-destructive field tests of compressive strength. The second are tensile field tester systems to either determine the tensile strength of an overlay or bond material, or tensile strength of anchors embedded in the concrete. The first group is pure Non-Destructive Testing where the strength of the material is determined by correlation to another parameter more easily available and readily apparent. This is typically the hardness of the concrete or the resistance to penetration by either a pin or probe. The Windsor Probe, Windsor Pin and our line of Rebound Hammers all fall within this category. These are widely used standard tests and as such have seen use throughout the world.
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Heavy Duty Circuit Tester with 12' Retractable Wire & Battery Clip
27300
Features an extra long wire that stretches up to 12 feet for use, then automatically retracts. Quickly and easily check electrical circuits and accessories on 6 and 12 volt systems. Great for use on cars, trucks, boats, trailers, motorcycles, airplanes and snowmobiles. Heavy duty ground clip with insulator. 3 1/4" standard length probe
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Heavy Duty Circuit Tester with Retractable Wire & Long Probe
27250
Features an extra long wire that stretches up to 12 feet for use, then automatically retracts. Quickly and easily check electrical circuits and accessories on 6 and 12 volt systems. Great for use on cars, trucks, boats, trailers, motorcycles, airplanes and snowmobiles. Heavy duty ground clip with insulator. 6 1/2" long, insulated probe.
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Beam Probes
The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Pilot VX
Pilot VX is a flexible, configurable flying Probe test system with an unrivaled set of technologically advanced tools, able to provide the test solutions required by the huge diversity which characterizes today’s electronics.
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30 GHz Differential Probe with 2.92mm Interface
DH30-2.92MM
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Autosamplers for Chromatography
Maximize the throughput and flexibility of your ACCQPrep system by adding automated sample loading for longer unattended operation.The two rack AS 2x2 and four rack AS 4x2 sampler options allow different chromatographic conditions to be applied to a variety of different samples and doubles or triples the fraction collection capabilities of the base system.The ACCQPrep AutoSamplers provide high recovery of samples with 99.9% transfer of analyte. PeakTrak software allows users to quickly create sample queues for walk up open-access labs and overnight purifications. Develop methods that result in the highest purity and largest loading capacity with the 3 Step Focused Gradient Generator that works seamlessly with the AutoSampler and PeakTrak software. An integrated wash station and sophisticated robotic probe movement ensures sample purity and limits cross contamination.
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Contactless Video Extensometers
Jinan Testing Equipment IE Corporation
Deformation measurement of samples during material testing with use of the Video extensometer MercuryRT allows applying multiple virtual probes (Movement Sensors)on markers and advanced image featuresto be tracked, including the natural pattern of the sample surfaces.The common resolution of standard system is within 500 nm and 5 m. The system fulfils class 0.5 or B-1 of classification according to ISO 9513 and ASTM E83. In certain camera use case, the system resolution reaches the level of 100 nm - 500 nm and system fulfils the class 0.2. The strain resolution can reach 10 microstrains. Material testing,Component testing ,FEA validation,Vibrography .
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Radius Radiation Probe
Hawk Radius®
The Hawk® Radius is a ruggedized solution for monitoring both ambient and elevated levels of ionizing radiation. Like a Hawk with its remarkable vision, the Hawk Radius Probe “sees” things that other probes cannot. The high sensitivity weatherized pancake sensor can provide early warning of changing ambient radiation conditions, while the energy compensated detector can accurately report penetrating gamma radiation dose rate at elevated levels. Radius probes are typically deployed as part of an environmental radiation monitoring program, or for safety and security systems. In its standard configuration the probe detects beta, low energy gamma and x-radiation with one channel and energy compensated penetrating gamma radiation levels with a second channel. It can be configured to detect alpha radiation as well. The Hawk® Radius has been deployed worldwide in demanding conditions for protecting communities and collecting environmental radiation data. It can be deployed easily and requires minimum maintenance. The Radius is compatible with Medcomʻs GeigerLink adapter and the IMI Gateway App for use with personal computers. It can also be used with most data loggers including popular Campbell Scientific models.
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Ultra-High Vacuum
KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
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HV Calibration
B-1027
Ross Engineering Corporation’s High Voltage Calibration Lab provides high accuracy capability for conducting tough reliability tests on all our high voltage devices. In this facility we test and calibrate HV Relays, HV Dividers, HV Probes, Spark Gaps, our Fiber Optic Systems, and HV Digital Voltmeters up to 450kV. We provide our own in house test lab to ensure Ross products meet or exceed required safety standards as well as our own high standards of dependability, long life and quality. Our technicians use test equipment calibrated by or traceable to National Institute of Standards and Technology or other national metrology institute to provide the highest in testing accuracy.
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USB Protocol Verification System
Voyager M310e
The Voyager M310e is Teledyne LeCroy's flagship USB protocol verification system designed for USB 2.0, USB 3.2, Type-C, and USB Power Delivery. Offering the industry's highest fidelity probe design, flexible traffic generation, and a range of turnkey Compliance packages, the Voyager M310e is the most complete platform for cradle-to-grave USB design verification.
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Digital Teslameters/Gaussmeters
S Digital Teslameters offer accurate, high resolution measurement of magnetic flux densities, withdirect digital readout in tesla or gauss, and serialcommunications by fiber optics or RS-232C for system applications.The instruments are light and compact, and the probes are easy to use. The DTM-151 has been engineered to withstandthe severe electrical interference produced by high voltage discharge.
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13 GHz Differential Probe with ProLink Interface
DH13-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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MANIFULATOR
As one of the most important module in Probe_Station, manipulator is an accurate system that probe micro distance() and contact on the electrode of semiconductor wafer, device. ECOPIA's Manipulator is very easy to use and probe arm's elastic plate is good to protect sample's surface, from being damaged by Z direction movement.
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DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Mid Bus Probes
MBP850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Coaxial Cable Termination Toolkit
ICFP
Ardent’s ICFP is a next generation coaxial cable termination toolkit for advanced system design de-embedding, de-bugging, and calibration. Designed for the lowest loss access to signal paths on an IC circuit footprint, this solution is a simple, cost effective alternative to expensive probers and x-y tables for Engineers who need to probe multiple signals at once.
