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- Pickering Interfaces Inc.
product
PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
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2 Channel Charge-Discharge Module 6 V, 100 A
BT2205A
The BT2205A is a 2 channel charge-discharge module 6 V, ± 100 A, 437.5 W for module Li-ion cell formation and lifetime cycling solution.
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HTOL RF Testing Systems
Becker Nachrichtentechnik GmbH
Fully Automatic Test Systems for Lifetime Simulations of Electronic Components. Each output offers a separate, analogue level control. This ensures highest precision in level during a long term usage. A graphical user interface enables an intuitive and easy control.
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LED Phosphorescence Light Sources
SpectraLED
Innovative and affordable pulsed light source for phosphorescence measurements from deep UV to NIRThe SpectraLED is a novel light source designed specifically for the measurement of phosphorescence lifetimes. These phosphorescence sources are based on LED technology and the emission wavelengths range from the deep UV to the NIR.
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Solar Simulator
Unisim Compact Solar Simulator
The Unisim Compact is a low-cost close-match solar simulator that provides the world-leading spectral match of our award winning Unisim solar simulators in a compact, bench top unit complete with IV measurement system. As with all our Unisim solar simulators, they exceed the ASTM, IEC and JIS international standards for spectral match and temporal instability. The easy-maintenance enclosure houses a TS-Space Systems 2-zone Unisim solar simulator which combines metal halide and incandescent sources via a proprietary filter system to give an AM0 close-match spectrum (AM1.5 drop-in filter sets are available). The standard system includes an embedded source meter with complete IV measurement system (Computer, GPIB interface, IV software, MS Excel), relative irradiance indicator for monitoring lamp intensity and an electrical shutter. Product support is very important to us. Training is provided at our premises where customers can take advantage of one-on-one tuition with the solar simulator designers and learn how to operate and maintain their tools. Extensive support via phone and email for the full lifetime of the instrument is included with every TS-Space Systems product.
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OLED Life Time Test System
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Minority Carrier Lifetime Tester
HS-CLT
HS-CLT Minority Carrier Lifetime Tester has strong functions. It can not only measure carrier lifetime of wafer but also silicon ingot, silicon filament,silicon phosphorus ingot,silicon boron ingot, seed crystal and other irregular shape silicon material.The minority carrier testing ranges from 1μs to 6000μs, the minimum resistivity is 0.1Ω.cm, (can be extensive to 0.01Ω.cm). Dynamic curve monitoring in the whole process.
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PXI-2799, 40 GHz, 50 Ω, Dual SPDT PXI RF Relay Module
782359-01
40 GHz, 50 Ω, Dual SPDT PXI RF Relay Module - The PXI‑2799 is a general-purpose single‑pole double‑throw (SPDT) switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2799 is also well-suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Solar Simulator
Unisim
TS-Space Systems is the first company to pioneer the use of metal halide sources in solar simulators for photovoltaic testing. The high temporal stability and close spectral match combined with the ability to control the output spectrum via multiple separate wavebands means the Unisim solar simulator is the only solar research tool designed for the accurate measurement of multiple junction devices, including the new generation of four junction devices. As with all our Unisim solar simulators, they exceed the ASTM, IEC and JIS international standards for spectral match and temporal instability. Using the latest HMI and halogen luminaire technology, the Unisim solar simulator provides a highly stable area of illumination. The simulators also use cutting edge filter technology in order to provide the best spectral match available for AM0 and AM1.5. Further to this, the spectrum can be achieved via two, three or four separate spectral wavebands which allows a high degree of spectral control for research and development. Product support is very important to us. Training is provided at our premises where customers can take advantage of one-on-one tuition with the instrument designers and learn how to operate and maintain their tools. Extensive support via phone and email for the full lifetime of the instrument is included with every TS-Space Systems product.
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Silver High Precision Fiber Optic Cleaver With Collector
SH-50S
Shenzhen Sharingtek Communication Co., LTD
Precise cleaved surfaces;· Smooth cleaving angle around 0.5 degree· Blade lifetime up to 2000 times each point, 24 cutting point, blade life time up to 48000times;· Automatic return of blade· Convenient design, easy to use;· Smart design of pressure pads preventing the fiber from damage by the return of blade carriage;· Easy operation to complete the cleaving and collection of waste fiber shards.· Main Body is made of aluminum material; Blade is magnesium alloy materials
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Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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PXIe-2542, 6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module
780587-42
PXIe, 6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module - The PXIe‑2542 is a terminated switch module suited for routing RF signals for production test applications. It features high-performance solid-state relays that offer unique benefits such as unlimited mechanical lifetime and fast switching time. Front-mounted SMA connectors provide easy connection to your RF devices, and the module features termination on every COM line and channel. The channel termination and COM lines help minimize reflections of the RF signal and protect your instruments.
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15W to 150W - Single Output
HWS-A Series
*Limited Lifetime Warranty*UL 508 approved*SEMI F47 Compliant (high line AC)*Universal Input (85 - 265VAC)*Higher Efficiency than HWS Series
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Digital Light Meter, Calibrated
93-172-C
Measures incandescent, fluorescent, metal halide, high-pressure sodium and halogen lampoutput. Color and cosine-corrected for enhanced accuracy. Measures up to 50,000 lux. Peak and data hold means no lost measurements. Accessories included: (1) 9V battery and carrying case. Lifetime Limited Warranty.
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PIN Photodiode
PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates with an applied reverse bias voltage and when the reverse bias is applied, the space charge region must cover the intrinsic region completely. Electron hole pairs are generated in the space charge region by photon absorption. The switching speed of frequency response of photo diode is inversely proportional to the life time. The switching speed can be enhanced by a small minority carrier lifetime. For the photo detector applications where the speed of response is important, the depletion region width should be made as large as possible for small minority carrier lifetime as a result the switch speed also increases.
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PXI-2584 , 12-Channel, 600 V, 1-Wire PXI Multiplexer Switch Module
778572-84
12-Channel, 600 V, 1-Wire PXI Multiplexer Switch Module —The PXI‑2584 is a high‐voltage PXI multiplexer switch module that is ideal for fuel cell and battery stack applications. The reed relays in the PXI‑2584 ensure longer lifetimes and faster actuation times for test equipment. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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8-Channel A/D & D/A Zynq UltraScale+ RFSoC Gen 3 Processor - PCIe
Model 7053
- Supports Xilinx® Zynq® UltraScale+" RFSoC FPGA- 16 GB of DDR4 SDRAM- On-board GPS receiver- PCI Express (Gen. 1, 2, and 3) interface up to x8- LVDS connections to the Zynq UltraScale+ FPGA for custom I/O- Optional front panel dual optical MPO interface for gigabit serial communication- Unique QuartzXM eXpress Module enables migration to other form factors- Navigator BSP® for software development- Navigator FDK® for custom IP development- Free lifetime applications support- Pentek's Quartz Family of Xilinx Zynq UltraScale+ RFSoC FPGA Products Video- Live Signal Acquisition Video: Quartz Model 5950 and Model 6001 RFSoC boards- Pipeline Newsletter: Strategies for Deploying Xilinx's Zync UltraScale+ RFSoC- Synchronize up to eight modules with Model 5903 High-Speed System Synchronization and Distribution Amplifier - 3U VPX- Please refer to the product datasheet for Installed FPGA IP Module details
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Boron Enhanced Diamond-like Carbon Hybrid Foils
can be increased by sandwiching a thin layer of boron between two layers of diamond-like carbon. MICROMATTER DLC-B hybrid foils contain between 5% and 10% boron.DLC-B foils have remarkable flexibility, higher tensile strength and hardness. In most applications, their lifetime in particle beams is significantly greater than regular DLC foils. DLC-B foils are recommended for applications that require highest mechanical robustness and improved durability under beam conditions.
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Flow Meter / Monitor
NivuFlow Mobile 600
The NivuFlow Mobile 600 was developed particularly for long-term measurements in field operation without external power supply. Measurements for checking and verifying can be carried out with the self-sufficient and portable system without any problems even in harsh environments. Battery lifetimes of several weeks or even months reduce personnel costs for maintenance and data readout significantly.
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Circuit Testing
Tester, Circuit GFI
*Use to troubleshoot 120 VAC grounded outlets and test GFCI receptacles*Light sequence indicates correct/incorrect wiring*Lifetime Limited Warranty
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Scanners
All BK Mikro scanners utilize servo motors for accurate measurements and increased lifetime.
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Ideal Remote Plasma Source For Oxygen-Based Processes
Rapid OX
Reduce recombination effects and extend the lifetime of oxygen radicals thanks to Rapid OX's removable quartz liner. When compared to anodized chambers, the resultant reactive species extended lifetime improves photoresist strip rates. And because the quartz liner is easily installed or removed by the operator, it decreases downtime and significantly lowers replacement costs.
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PXI-2597, 26.5 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module
778572-97
26.5 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module—The PXI‑2597 is ideal for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. The internal termination of the PXI‑2597 helps prevent high-power reflections that arise from open channels on the module. You can use the PXI‑2597 onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Laser Diodes
With over 30 years of considerable experience in photonics industry, USHIO offers a wide range of high-quality Laser Diodes. They are available in different intensities and sizes, suitable for each and any application. These are industrial quality, reliable laser diodes offering high powers and low operating currents, long lifetimes and energy efficiency. All USHIO laser diodes are RoHS compliant. It is also possible to produce Laser Diodes to customer specifications. We offer technical support helping you select the ideal laser diode to get the most from your application. For laser diodes we are offering both test data and wavelengths selection on request. Please feel free to contact us (link) – we will be happy to help you.
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Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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Minority Carrier Life Time System
MWR-SIM
MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.
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Environmental Chambers
Sanwood Environmental Chambers Co ., Ltd.
Sanwood climatic chambers for battery can be tested under controlled temperature and humidity conditions, similar to the conditions under which batteries operate during their lifetime.
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Battery Internal Resistance Tester
HDGC-3915
HD Power Test Equipment Co.ltd
Battery Internal Resistance Tester is designed using the advanced AC discharge measurement method to test accurately voltage and resistance of battery. It is strictly designed to evaluate battery performance, state and life-time, which maintain all stationary power systems including Uninterruptible Power System. Battery Internal Resistance Tester can proceed the measurement in a group and in a single section of battery. With accurate testing of resistance and voltage, it gives an indication of battery capacity and technical status. The measurement data can be read on the instrument display directly. And it can also be uploaded to PC simply by using the USB drive. With the analyzing software, you could not only keep a record of the testing result but also have detailed analyzing for the status of batteries in different testing conditions.
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C/I Clamp Meters
*AC current measuring capability up to 400 amps*Compact size, fits easily into tool pouch*Data hold and Max hold to capture important readings*Lifetime Limited Warranty
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Service and Support
SICK LifeTime Services is a comprehensive set of high-quality services provided to support the entire life cycle of products and applications from plant walk-through to upgrades. These services increase the safety of people, boost the productivity of machines and serve as the basis for our customers’ sustainable business success.
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Contactless Lifetime Measurement and Inhomogenities Device
MWR-2S-3I
Lifetime determination is based on measuring photoconductivity decay after pulse light photo-exciting with usage of reflected microwave as probe.Simultaneous IR light transmission gives possibility to detect any inhomogenity insidesilicon brick and made 3D image of defects.
