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Digital VIS-SWIR Camera
OWL 1280
Using a 1280 x 1024 InGaAs sensor from SCD, the OwL 1280 offers visible extension from 0.6µm to 1.7µm to enable high sensitivity imaging. The 10µm x 10µm pixel pitch enables the highest resolution imaging. It will offer less than 28 electrons readout noise (rms) and with a high intra-scene dynamic range of 51dB, this enables simultaneous capture of bright & dark portions of a scene. Available with a 12 bit medium Camera Link digital output, the Owl 1280 will run from 10 to 60Hz. The camera features an on-board Automated Gain Control (AGC) which enables the best contrast image from low to bright light. The camera also has an on-board intelligent 3 point Non Uniform Correction (NUC) providing the highest quality images. As with all Raptor cameras, the Owl 1280 is ultra compact and rugged. The camera sensor temperature is stabilised to 15°C and the camera does not have a fan.
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Scanning Electron Microscope (SEM)
Prisma E
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Thyratrons and Accessories
Cargo scanning is a broad term which encompasses intelligent logistics, sniffer dogs and X-ray inspection. X-ray inspection systems offer rapid, non-invasive checking of manifests, detection of contraband, and when combined with other techniques, can be used to identify the presence of nuclear material. X-ray energies up to 10 MeV are required to penetrate fully loaded shipping containers and vehicles. These X-rays are generated through the acceleration of electrons along a linear accelerator into a target using megawatt energy microwave pulses produced by the RF sub-system.The skills for the design, manufacture and integration of specialised components for low-cost systems reside mainly in commercial companies. There is an emerging trend for linac system companies to demand higher performance from their integrated RF sub-systems.Currently, we intend not only to drive the innovation and development in this area, but also to offer integrated RF sub-systems to meet new requirements such as, portability, material discrimination and higher throughput.
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ORP Meters
ORP (Oxidation Reduction Potential) measures a system’s relative state for gaining or losing electrons. ORP values are affected by all oxidizing and reducing agents, not just acids and bases that influence pH measurement. In practice, ORP measures the ability of a lake or river to break down waste products, like contaminants and organic matter. When the ORP value is high, there is lots of oxygen present in the water.
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Power Couplers
Communications & Power Industries
CPI BMD has extensive experience working with the world’s best accelerator scientists and engineers to fabricate power couplers for superconducting accelerators. - Used in superconducting accelerators- Found in free electron lasers- Found in Spallation neutron sources- Used in energy recovery LINACs- Used in Third harmonic cavities
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Osmometer
LD-LOSM-A10
OsmometerLD-LOSM-A10is colorful LCD touch display with sample size 50 μl to 100 μl and measuring range up to 0 to 3000 mOsmol /kg H2O at ambient temperature 10 to 30°C. Features with on-screen display of molar concentration, freezing point, and osmolarity. At very low testing time it provides fast and accurate osmolality test results. Applicable in General medicine, Routine and research, Forensic medicine, Electron microscope.
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kSA 400
The kSA 400 puts the power of Reflection High-Energy Electron Diffraction (RHEED) at your fingertips. Whether analyzing a static diffraction pattern, or acquiring data during high-speed substrate rotation, the kSA 400 helps you exploit the valuable wealth of information contained within the RHEED pattern.
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DC Power Supplies
Is the unidirectional flow or movement of electric charge carriers (which are usually electrons). The intensity of the current can vary with time, but the general direction of movement stays the same at all times. As an adjective, the term DC is used in reference to voltage whose polarity never reverses.
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X-Ray Systems
X-ray and radioactive devices developed by AET, are widely utilized for medical, industrial and research use. The Compact Pulse X-ray Source can accelerate electron beams in a high-gradient electric field, to produce X-rays. Dose Calibrators are utilized for radioactive examinations and treatments in the medical industry.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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EBSD Detector
Symmetry
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Sputter Coater & Freeze Fracture Solutions
To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
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High Power Microwave Plasma System
The High Power Microwave Plasma System features the High Power Microwave Plasma Source, generator (with isolator) and auto-tuning system comprised of the Precision Power Detector and SmartMatch® unit. This comprehensive system delivers a high concentration of radicals with low electron temperatures for the highest dissociation and lowest recombination rates.
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Fluorometers
A fluorometer measures the light or radiation emitted by fluorescent objects. Fluorescence occurs when light of a specific wavelength strikes and electrons in the sample.MRC provides a wide range of Fluorometers for Laboratories.
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PIN Photodiode
PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates with an applied reverse bias voltage and when the reverse bias is applied, the space charge region must cover the intrinsic region completely. Electron hole pairs are generated in the space charge region by photon absorption. The switching speed of frequency response of photo diode is inversely proportional to the life time. The switching speed can be enhanced by a small minority carrier lifetime. For the photo detector applications where the speed of response is important, the depletion region width should be made as large as possible for small minority carrier lifetime as a result the switch speed also increases.
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CMAS Analyzers and Field Monitors
Backed by at least one of the 8 corrosion sensor patents wholly owned by Corr Instruments, our nanoCorr analyzers and field monitors are widely used for online and real-time localized and general corrosion monitoring. These ultra-high precision instruments measure extremely low currents in the pico-ampere levels, which can be translated into a corrosion rate as low as a few nanometers per year, in some applications (PDF). Our analyzers and monitors are based on the patented coupled multielectrode array sensor (CMAS) technology which measures the flow of electrons from corroding electrodes to one or more cathodes.
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Level Detectors
Becker Nachrichtentechnik GmbH
Becker Nachrichtentechnik offers selective RF level detectors for air interface monitoring. The detectors are especially designed for frequencies used in e.g. electron accelerators. Due its mechanical design, the modules are compatible to cable route mounting systems. The detection of unintentional RF radiation is a main application field.
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Microwave Tubes
TRAVELING WAVE TUBES (TWTS), MAGNETRONS AND KLYSTRONS
Communications & Power Industries
CPI TMD has been immersed in the research, design and manufacture of electron devices since its inception, delivering solutions into some of the most demanding applications to support its customers’ requirements. CPI TMD's tube engineering "DNA" extends back to EMI Electronics' high-power klystron developments during World War II. Since then, CPI TMD has been instrumental in many of the industry's major TWT, magnetron and klystron developments.
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TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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SPA100
Our highly sensitive source picoammeter is designed for measuring and logging very small currents down to the pA range - making it an ideal instrument for scientific and research applications, including physics, materials science and electron microscopy. Full-featured at an affordable price, the SPA100 combines sensitivity, accuracy and stability to allow users to measure low currents with high precision as well as conveniently source bias voltages for experimentation. SPA100 also doubles as an ultra-high resistance meter, measuring accurately into the teraohm range. As with all our “headless” products, the SPA100 connects to PC via USB and utilises our complimentary software EPIC - enabling users to easily measure, graph and capture readings with timestamps and measurement stability information.
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Scanning Auger Nanoprobe
PHI 710
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Electron Sources
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Analysis System
Pegasus (EDS-EBSD)
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Avalanche Photodiodes
These avalanche photodiodes (APDs) are silicon photodiodes with an internal gain mechanism. As with a conventional photodiode, absorption of incident photons creates electron-hole pairs. A high reverse bias voltage creates a strong internal electric field, which accelerates the electrons through the silicon crystal lattice and produces secondary electrons by impact ionization. The resulting electron avalanche can produce gain factors up to several hundred.
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Electron Probe Microanalyzer
EPMA-8050G
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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E-Beam Power Supplies
Maximize image quality and repeatability. Designed for scanning electron microscope tools, Advanced Energy’s precision e-beam technologies deliver impressive performance, accuracy, and reliability.
