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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Pickering Interfaces Inc.
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PXI Power & Sense Multiplexer, 2-Pole, 18-Channel
40-658A-002
The 40-658-002 is a PXI multiplexer combining a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in a convenient single slot PXI module. It is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test.
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Acoustic Test Chambers
Small Device Test Chambers are used for >Basic sound level measurement of small products and equipment >Pre-compliance testing of small products and equipment >End of line manufacturing test on small products and equipment Small Device Test Chambers provide acoustic isolation from outside sounds and/or reduce the sounds from the device under test radiating into the host
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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2-Axis Rate and Position Tables
When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Shock Testing
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Multimedia Test Video Generator/Analyzer
882EA-DP
The Teledyne LeCroy quantumdata 882EA-DP test instrument with both a DisplayPort 1.1 transmitter and receiver (analyzer) option is packed with features for video and audio testing of DisplayPort monitors and sources at pixel rates up to 268 MHz. The 882EA-DP test instrument provides two (2) additional DisplayPort ports for passive monitoring of the link layer through the optional Aux Channel Analyzer (ACA) application. The ACA option enables you to monitor link training transactions either between the instruments Tx port or its Rx port with the DisplayPort device under test. The 882EA-DP instrument can optionally be equipped with industry approved compliance tests for Link Layer, EDID and HDCP 1.2.
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PXIe-4140, 4-Channel Source Measure Unit
781742-01
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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PXIe-2748, 3 GHz, 16x1 PXI RF Multiplexer Switch Module
780587-48
PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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1kV, 80 MHz High Voltage Differential Probe with 6m Cable and Auto Zero Disconnect
HVD3106A-6M
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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SART Tester
The International Marine Organization states that all GMDSS equipment (including SARTs) should be periodically maintained and verified to meet all the performance requirements. In case of test failure, ships may be detained in a port under SOLAS regulation IV/15.8.The 9GHz Search and rescue radar transponder (radar-SART) is indispensable safety device and it must be checked regularly or annually during radio inspection.The purpose of an annual testing is to determine that SART is operational as defined in appropriate performance standards for Survival Craft Radar Transponders for use in Search and Rescue Operations, IMO Resolution A.802 (19).
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Ground Continuity Test Instrument
MODEL M25
Performs ground continuity tests in full compliance with BSI, VDE and IEC. Measures AC resistance from Chassis of Device Under Test (DUT) to power-cord ground lead - 0 to 0.15 ohm
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NI-9224, ±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783862-01
±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9224 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9224 is simultaneous sampling with two options for filtering a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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128-Ch 0,250A-100VAC 24VDC Multiplexer/Matrix
YAV90128
A unique YAV90128 module is able to do all combinations of signal computation at low frequency between the device under test and the various measuring instrumentation inside a test system.
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Automatic Metallic Pendulum Impact Testing Machine
Jinan Testing Equipment IE Corporation
JB-450/750A automatic type pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and is capable of doing a large number of impact tests continuously. The automatic type pendulum impact tester can display the impact power, impact toughness, and the pendulum's rotation angle. All the testing reports can be printed out. JB-450/750A can be equipped with fully automated sample feeding system, which greatly improves the test efficiency, and reduce labor intensity. The crygenic cooling device is available for impact tests under the lowest temperature down to -196 C. The automatic type pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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ISI Channel Boards
M8049A
The M8049A ISI channel boards can be used to emulate channel loss in receiver test setups. The boards are used to emulate channel loss for data rates of 32 Gb/s and higher. A choice of 21 PC board traces with different lengths can be inserted into the signal path. The trace lengths range from 0.8 inch (20.3 mm) to 22.3 inch (566.4 mm). By cascading the traces within one board or with another board, a wide range of channels can be emulated with very fine resolution of insertion loss steps. With their small size the ISI channel boards can be located closely to the device under test.
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Keysight Dual/Quad 4x8 Reed Matrix for 34980A
34933A
The Keysight 34933A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 2-wire configurations 64 2-wire or 128 1-wire cross-points High-speed reed relays Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter ±150 V peak, .5 A switch, 1.5 A carry current
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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PCIe 6.0 Protocol Analyzer
P5570A
Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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12-Ch 10A-250VAC RCV Power Distribution Unit
YAVAR438
- Hardware controlled Enable Input- 12 Power relays up to 10A 250VAC/DC and 300W or 2.700VA switching power- 12 10-mOhm shunt resistors.- 6 Switched 2-Pole sense channels- Single phase isolated or 3-Phases non-isolated switching capabilities, to or from the device under test (power or load)- VPC TriPaddle 96 pins connector.- NI LabView & TestStand driver.- .NET, C/C++, VB driver.- Soft Front panel for direct interface.- CAN Control or Ethernet (with Ethernet to CAN Gateway).- Self-test module available.- Form A
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EMC Test Systems
The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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PXI Battery Simulator Module
41-750-001
The 41-750 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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Automatic Calibration Module
ACM2520
ACM2520 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 20 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full 2-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Logic Analyzer Probes
Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
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RF Shielded Box
TS7124
R&S®TS7124 RF shielded boxes enable reliable and reproducible measurements in shielded test environments. The R&S®TS7124 shielded box provides high shielding effectiveness, a good antenna coupling factor and a rugged mechanical design for reproducible results. RF test boxes have been designed not only for product designers or product optimization but also for production lines of wireless devices under test. The soft close feature makes the shielded box safer to operate.
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Regenerative Power System, 80 V, ±250 A, 10 KW, 200/208 VAC
RP7935A
The Keysight RP7935A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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1kV, 120 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3106A-NOACC
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Regenerative Power System, 950 V, 20 A, 10 kW, 400/480 VAC
RP7963A
The RP7963A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
