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Defect
other than specified, imperfection .
- InterWorking Labs, Inc.
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Network Emulator
KMAX
The KMAX network emulator helps network engineers test and measure performance in order to identify and remove defects. Network emulators turn well behaved development and test networks into the kind of slow, congested, and less-than-reliable services encountered on the internet. In addition, unlike the real internet, network emulators allow the operator to control these conditions so that products and apps can be subjected to controlled and repeatable tests, by routing selected packets through a series of impairment nodes.
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Manual Testing Services
With manual testing services, we will hand-pick a team dedicated solely to your project. Our professionals will work with your developers, business analysts, and managers to go over requirements, build a comprehensive test plan, design thorough test cases, rapidly execute the tests, help remediate defects, and retest until the project is satisfactorily completed. The same individuals will be with you from beginning to end, so they have a complete understanding of the project and how you want it done, and you will always know exactly who you are dealing with. The same QA Engineers that develop the test cases will also execute them, leaving no room for misunderstandings and greatly expediting the process.
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Bushing Monitoring
Qualitrol Bushing Monitor System is an on-line Tanδ (PF) and Capacitance monitoring system for substation bushings. It measures the phase difference induced by capacitive layers of bushings and calculates the rate of change to predict defects in bushing insulation.
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DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
Identifies defect position instantly- contributes to saving inspection time
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Compact Manual Laser Repair System
LRS-2400
LRS-2400 reads the defect data and navigates to the exact location of the defect. With a high power microscope the user can perform tasks as described below.
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SlipFinder
YIS and SF Series
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
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Open Source Service to Help Secure and Trust Your Software
Community Attestation Service / CAS
- CAS stores all signatures inside of immudb, the standard for open source immutable databases.- CAS is protected against tampering. All attestation data is integrity-checked and cryptographically verified by the CAS client.- CAS is also protected against MITM attacks. The public key below is checked by every communication.A Software Bill of Materials (SBOM) is a list of components in a piece of software.Like a list of ingredients on food packaging -- where you might consult a label to avoid foods that may cause an allergy -- SBOMs can help companies avoid use of software that may harm their organization.If defects are later found in a specific part, the SBOM makes it easy to locate affected products.
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MicroDetect Basic
MDb-01
Hachmann Innovative Elektronik
MicroDetect basic is a handy, exact and simply useable voltage detector and interface-tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-tester warns against defect interfaces.
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Front-end
With geometries getting smaller, macro inspection becomes both more challenging and crucial for defect-free and high-yield wafer manufacturing. The variety of defects calls for detection optimization, fast screening and categorization of the high volume manufacturing environment, while maintaining high throughput.
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Static Code Analysis for Embedded Software
GrammaTech CodeSonar®
CodeSonar is GrammaTech´s flagship static analysis software. Able to analyze both source code and binary code, it is specifically designed for zero-tolerance defect environments. With its advanced static analysis engine, CodeSonar is one of the most effective tools for eliminating the most costly and hard-to-find software defects early in the application development lifecycle. Compared with other tools, CodeSonar identifies twice as many defects that result in system crashes, leaks, data races, memory corruptions and security vulnerabilities.
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Interoperability Testing Services
Using our decades of knowledge and experience of Bluetooth, markets and products we'll help you deliver products which are free of defects, minimize field issues, lower development costs and reduce time to market. Teledyne LeCroy offers test services to help in all stages of product development from Specification to Market Launch and beyond.
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Permanent Monitoring
Real-time Ultrasound and Vibration data indicate changes in healthy function earlier in the P-F Curve than other condition monitoring technologies. Advanced warning allows every maintenance job to be planned while reducing levels of critical spares held in inventory. Reliability teams benefit from a proactive culture that affords them time to eliminate defects rather than simply applying band-aids.
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Ultrasonic Testing
Pundit 250 Array
The Pundit 250 Array brings a quantum leap in the ultrasonic pulse echo testing. A number of unique innovations make the Ultrasonic multi-channel instrument the best and fastest solution for thickness measurements, detecting defects and localizing objects which cannot be easily detected by any other technology. This includes the assessment of thick concrete elements such as tunnel linings as well as pipes and tendon ducts beyond the rebar layer.
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Metal InspectionSystems
Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
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Isolation Tester UIP
The devices of the UIP (Union Isolations Prüfer) isolation tester series are used to test the pore-free condition of corrosion protection coatings of pipes, vessels or plant system parts. The battery-powered device generates test voltages between 5 kV and 30 kV, which are applied to the grounded test object via test electrodes. The location of a defect is signalized by a spark-over with an additional audible warning.
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Defect Inspection Module
EB40
The Class 1 certified E40 and B40 modules (available separately or combined in one module) can automatically detect defects on the entire edge, from zone 1 to 5, and the entire backside. The ability to inspect the entire backside allows for faster root-cause analysis of zone 5 defects since such defects can migrate from the wafer interior.
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Electrical Testing
Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Luminescence Defect Inspection System
INSPECTRA® PL Series
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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Ultrasonic Flaw Detector
MFD660C
MFD660C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed premium product, has a lot of advantages like unique design, sophisticated manufacturing, convenient operation, powerful function. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module， it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways in one body, customers with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.
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VisualDetect LCD Voltage Detector / Interface Tester
VDL-01AB
Hachmann Innovative Elektronik
VisualDetect LCD is an easily operated voltage detector and interface-tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-tester warns against defect interfaces. Additionally the LC-display indicates the measured current [I/A] and frequency [f/Hz]. Thanks to the integrated configuration menu it can be adjusted to switchgears operated below nominal voltage on-site.
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WireChop
A cost-effective, proven defect chopper system that works with both bench presses and automatic machines
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Halt Hass Chambers
HALT and HASS chambers from WEIBER provide extreme temperature & vibration capabilities used during the product design and manufacturing cycles to compress the time normally required to identify design and process weaknesses. HALT techniques are important in uncovering many of the weak links inherent to the design and fabrication process of a new product. HASS techniques are incorporated during the production phase to find manufacturing process defects that could cause product failures in the field.
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Wafer Inspection System
AutoWafer Pro™
AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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ClicManage
ClicManage is an easy to use and seamless test management solution that improves test productivity by managing requirements, releases, test plans, milestones and defects with reduced maintenance effort. It helps in building a strong foundation for your QA practice by providing visibility to better maneuver testing via one easy-to-use planning, delegating, tracking and reporting hub. Moreover, ClicManage can be interfaced with any third party defect tracking tools along with our proprietary ClicBug.
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Front and Back Side Topography Defect Detection
LIGHTsEE
High throughputNanometer range vertical sensitivitySimultaneous double side inspectionNanotopography and Topography measurementDetection of Slip lines, particles, Hairline cracks, SOI voids, Comets, EPI defects…Compliant with thin or thick wafers, taiko wafers, highly warped wafers
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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Advanced Metrology System
NGS 3500L
This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile processdevelopment system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.
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AI ANALYZER
Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.
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Package Leak Detectors
Packages should be absolutely leak tight. However, even with the utmost care in the process, faulty packaged products cannot be completely avoided. Defects in the sealing process or in the material can easily lead to leaks, sometimes microscopically small.
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Monitroing and Control
THANKS TO OUR ADVANCED DATA ANALYSIS FUNCTION AND EASY-TO-VIEW USER INTERFACE, YOU CAN IMPLEMENT SPC WITH VERY LITTLE EXTRA WORK. OUR MONITORING SOLUTION IS DESIGNED TO IMPROVE THE TRACKING THE DEFECT AND CAN BE EASILY CORRELATED WITH YOUR MANUFACTURING PARAMETERS FOR ROOT-CAUSE ANALYSIS.
