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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
- Pickering Interfaces Inc.
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PXI/PXIe USB Data Comms Multiplexer, 8-Channel
42-737A-901
The 40-737A-901 (PXI) and 42-737A-901 (PXIe) are 8:1 USB multiplexers for switching USB1 and USB2 data and power connections with USB connectors. The data signal paths are 2-pole arranged as differential pairs as defined by the USB standard. The signal pair has a controlled differential impedance and the multiplexer has been designed for minimum insertion loss.
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PDBase II
Even very skilled operators will find hard to make a diagnosis, in situations as the one mentioned above, through a mere visual evaluation of the pattern graph . Techimp new technology bases itself on the principle that efficient separation and identification of PD data can be achieved collecting PD pulses themselves and not only, as digital instrumentation commonly available does, PD pulse peak and phase.
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VPX
The VPX standard defined by ANSI/VITA 46.0 is a modern derivative of the older VME standards that is primarily targeted at defence applications, leveraging latest technologies in high speed electronics in order to provide higher performance computing, improved ruggedisation and thermal management capability, higher I/O densities and improved maintainability due to better immunity to ESD. Data Patterns has designed and manufactured a broad range of VPX products required for high end Radar / Electronic Warfare / Image Processing and Sonar applications.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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VME
One of the world's leading architectures for high reliability electronics applications is the VME platform.The VME standard is managed by the VME bus International Trade Association, VITA.Embedded computing's most successful bus standard, VME bus, shows no signs of slowing down as it maintains it's position as the industry's de facto standard into the 21st century. The foundation of VME's longevity, namely it's steady rate of technological evolution combined with a commitment to backward compatibility with legacy hardware and software, has been the linchpin of it's popularity for nearly twenty-five years. Today, innovative enhancements to the standard, through the VME Standards Organisation (VSO), continue to improve VME bus' speed, performance and reliability, strengthening it's position as the ideal solution for today's increasingly stringent commercial, industrial and military system requirements (Source: VITA).Data Patterns has implemented a number of standard VME boards, driven by Customer needs for Processor and I/O requirements in this platform. Today, standard modules are available covering the needs of:
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Video Pattern Signal Generator
Model A223800/01/02/03/04
Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader
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kSA 400
The kSA 400 puts the power of Reflection High-Energy Electron Diffraction (RHEED) at your fingertips. Whether analyzing a static diffraction pattern, or acquiring data during high-speed substrate rotation, the kSA 400 helps you exploit the valuable wealth of information contained within the RHEED pattern.
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PXIe-6536, 32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module
779988-01
32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module—The PXIe‑6536 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Communication Test Set
Eye-BERT 100G
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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EBSD Detector
Symmetry
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Avionics Suite Tester
Based on order from the Navy, Data Patterns developed the complete Automated Test Equipment required for validating all the Line Replaceable Units (LRUs) utilized in the Seaking Helicopter. The upgrade was carried out at multiple Naval bases in India.
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USB Reusable Temperature and Humidity Data Logger
This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Logic Analyzers
The PC-based Logic Analyzers are controlled with easy-to-use Windows software. This allows for more organized data display (with color-coded data and increased screen size), intuitive user interface, and data management (file saving, loading, sharing and exporting to other software and reports). This provides the familiar Timing and Statelist displays. However, they are much larger than those found on a standalone Logic Analyzer. Many also have Pattern Generators (digital word generators) that can output digital data.
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Dual Channel Bit Synchronizer for Rates up to 45 Mbps
LS-45-DB
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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Non-contact Ultra-High Range Sheet Resistance Measurement System
CRN-100
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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Renewable Energy Loggers
Data Loggers measure AC & DC circuits for Renewable Energy installations. Record directional flow of current, determine patterns when your system is importing or exporting to the grid.
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PAM4 Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
Golight PAM4 BERT integrates a 4-CH or 8-CH multistage pulse pattern generator (PPG) and a highsensitivity error detection (ED) to achieve BER measurement of data transmission in 200Gbps and 400Gbps. PAM4 BERT provide the best solution for automated production testing of 200G and 400G highspeed optical transceiver.
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Digital/Pattern/PE Card
PE32H
The PE32H represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32H offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PE32H also supports deep pattern memory by offering 32M of on-board vector memory with dynamic per pin direction control and with test rates up to 66 MHz. With new 32M log memory, PE32H can capture 32 channels data or fail log.
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Operational Intelligence platform
jKool
Operational Intelligence platform as a Service designed to derive meaning from high velocity machine data (FastData) in near real-time. It enables teams to analyze data from various sources such as applications (web, cloud, mobile), logs, transactions, mobile devices, IoT and help you make data driven decisions. Unified application analytics across apps and data silos. Detect patterns, bottlenecks, and anomalies within and across apps.
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Brahmos Checkout
Data Patterns designed and built the BrahMos Missile Checkout Equipment based on the requirements and support of DRDO and BrahMos. This unit validates the complete performance of the Missile through interfacing with it's umbilical and maintenance connections. The shelter mounted checkout equipment is utilized to test the articles on the field during it's life cycle, thus ensuring readiness for launch on demand.
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RF
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and an attitude to utilise the latest technologies.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
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Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Time Controller
ID900
IDQ’s Time Controller is an all-in-one device designed for flexibility and it efficiently solves a large number of problems encountered in the laboratory. Its core consists of 4 high-speed (<20 ps precision, 100Mcps rate) inputs and 4 high-speed outputs, interconnected by reconfigurable logic. The Time Controller performs the functions of a number of devices: time-to-digital converter, coincidence counter, delay generator, pattern generator, counter and discriminator. This is complemented by a 10Gbps link to the host computer for fast data transfers, by auxiliary analogue and digital I/O for interfacing with external devices.
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Direct conversion from cycle driven simulation data
Test program generator
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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Cable Testers
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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PC-based logic analyser
Annie-USB
A top-quality 8-channel PC-based logic analyser with probably the highest specifications in its class, this Janatek product is excellent value for money. It captures data at a maximum rate of 500MHz, has a buffer depth of up to 1 Meg samples per channel, and incorporates an 8-bit pattern generator to aid debugging.
