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Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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AC/DC Leakage Current Tester
228
Test for dangerous leakage current with the Simpson Model 228, designed to meet the latest UL, IEC, and ANSI specifications. The 228 detects both AC and DC leakage current and simulates human response at three different levels -- reaction, let-go, and burn hazard. Each Model 228 comes with test leads with alligator clips, manual, and batteries.
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Polarity & Burn in Test Systems
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
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Horizontal Flammability Tester
Part Number:
TESTEX Testing Equipment Systems Ltd.
Horizontal Flammability Tester, to determine the comparative burn rates and burn resistance of textiles, particularly those for automotive interior use. Horizontal flammability tester is safe and easy to operate, Comprises draft free stainless steel cabinet with observation window, sample holder and door mounted burner. Horizontal Flammability Tester complies with ISO 3795, ASTM D5132,FMVSS 302, etc.
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Burn Down Transformer
ATG 2
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR ATG 2. The ATG 2 burn down transformer is used for impedance reduction of cable faults in low- and medium-voltage networks. The short-circuit proof 2300 VA stray field transformer delivers a maximum voltage of 10 kV and is housed in a fully enclosed 19" housing.* Portable device for changing the fault resistance* Useful for cables that are difficult to access* Proven methods for complicated faults* Independent current and voltage control on each burning level
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Electric Burn-in Board Carts
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Stamped Spring Pin Sockets
Ironwood Electronics SBT sockets are small footprint sockets that are compatible with other product lines such as GHz elastomer sockets, Giga-Spring sockets, etc. The socket needs about 2.5mm extra space around the chip than the actual chip size utilizing only very small PCB real estate. A heat sink screw on the top provides the compression force as well as thermal relief and can be customized to dissipate more power. SBT socket uses SBT contact technology for high endurance and wide temperature applications. SBT Contact is a stamped contact with outside spring as well as inside leaf spring that provides a robust solution for Burn-in & Test applications. Solutions are available for 0.3mm to 1.27mm LGA, BGA, QFN, QFP, SOIC and other packages. Contact technology has 3 part system which includes top plunger, bottom plunger and a spring. The Beryllium Copper plungers are stamped and assembled to a stainless steel spring in an automated system to enable fast turnaround time, low cost and zero defects.
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Wireless Digital Multimeter 6000 count / NCV / SPT / Anti Burn Protection and with free "K" type temperature sensor (-40°C ~ 250°C).
MS-W2036P2T
This is a Palm size, external wireless connectivity Digital Multimeter integrated with 6000 Count, True RMS auto and manual measurement.
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Environment And Burn-in Temperature Chambers
9000 Series
Delta 9000 Series Temperature Chambers offer a wide choice of temperature ranges and capacities in addition to smart electronics. Field proven by satisfied customers for over four decades, Delta chambers are quality instruments that provide service longevity and integrity unique in their field. Over the years, Cohu has added advanced features to the proven basic chamber design and has refined system components and programming capability to deliver outstanding quality and value.
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Head Mounted Temperature Transmitters
Datexel manufactures a large range of head mounted temperature transmitters. Field proven and high accuracy are the ingredients in the Datexel range of head mount temperature transmitters. Low cost, fully isolated, PC programmable, direct or inverse output, up scale or down scale burn out are just some of the features available on the Datexel range of head mounted temperature transmitters.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Qualification Hardware & Sockets
Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include: HTOL Boards (Mother and Daughter cards) Burn-In Boards HAST Boards THB (humidity) Boards Burn-In Modules and frames Dynamic Driver cards (Digital, Analogue and Mixed signal) Back Planes Voltage regulator cards Custom electro-mechanical assemblies DUT Cassettes and test Fixtures
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Burn-in and Stress Screening Chambers
KDR
Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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QFN/QFP35 Sockets
Test sockets are designed for testing today’s high-performance QFN, QFP, DFN and SOIC devices. For development, characterization, at speed burn-in, and low volume production manual testing.
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45 Degree Flammability Tester
TESTEX Testing Equipment Systems Ltd.
45 Degree Flammability Tester, to determine fabric flammability under controlled conditions total automatically(fabric burn test). 45 Degree Flammability Tester complies with ASTM D1230, CALIF TB117, FTMS191-5908, etc. Our product is the best choice for you when you do flammability test for fabric in flammability testing labs.
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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Burn-in Systems
Incal Offers A Line Of State-Of-The-Art Burn-In Testing Hardware And Software For Retrofit And/Or Total, Customized Burn-In System Configurations.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Multi-Channel Controllers
7000 Series
The new 7000 Series MultiSource Multi-Channel Controller is designed for applications requiring a large number channels in a cost-effective and compact solution. With both laser driver and temperature controller options, the MultiSource is an excellent building block for system applications such as device burn-in and characterization.
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Burn-In Board Tester
Focus-275
Focus275 is a tester for burn-in board.It can improve reliability of burn-in board by inspecting boards for burn-in test by Focus275 regularlyBoth short open test and component test can be done by sending electric signals for special socket contactor and edge part.
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Sensirion SHT31-DIS-B Humidity and Temperature Sensor Breakout Board
SEN-37002-H
Breakout board for the Sensirion SHT31-DIS-B. This sensor is an extremely accurate digital (I2C interface) temperature and humidity sensing device, with +/-0.2C temperature and +/-2% humidity accuracy typical. These specs far exceed the accuracy of ICs that came before it, including the HTU2x and SHT1x series, and improves upon the success of the SHT2x that came before it. In addition, the SHT31-DIS-B has a wide input voltage range of 2.4V-5.5V and includes temperature isolation and airflow cutouts as recommended for the optimal operation. Finally, in the case of environmental changes that could cause light condensation, the SHT31-DIS-B has a built-in heater to burn off any condensate.
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5 ½ Digits Dual-Display Digital Multimeters
SDM3055
The SIGLENT SDM3055-SC includes a multiplexer that provides multi-point measurement capabilities. The scanner features 12 multi-purpose + 4 current channels and supports the following measurement functions: DCV, ACV, DCI, ACI, 2WR, 4WR, CAP, FREQ, DIODE, CONT and TEMP (RTD and Thermocouple ). It provides a convenient and versatile solution for test applications that require multiple measurement points or signals and is an ideal tool for R&D burn-in and production testing.
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Medical Storage Chambers
KDM
The Bemco KDM is similar to the Bemco Koldburn KDR except it has a circular air flow conditioning system located on the chamber ceiling, and is optimized for shelf supported temperature cycling, burn-in, stress screening, and storage of valuable pharmaceutical products or medical devices.
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Laser Diode Light Current Voltage (LIV) Test Instruments
The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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J-Detect Pro
With J Detect, rest assured about the results. Its highly accurate scanner misses nothing and can also detect if the diamond is enhanced or treated at a budget that doesn’t burn a hole in your pocket.
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Vertical Flammability Chamber
TESTEX Testing Equipment Systems Ltd.
Vertical Flammability Chamber for measuring the vertical flame spread of children’s sleepwear, fabrics (fabric burn test), other textile materials or resilient filling materials used in upholstered furniture. Vertical Flammability Chamber complies with ASTM D6413, CALIF TB117, 16CFR Parts1615/1616, etc. Please contact us for more information about flammability test method.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
