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Electron Multiplication (EM) Standard Image Sensors
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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ORP Meters
ORP (Oxidation Reduction Potential) measures a system’s relative state for gaining or losing electrons. ORP values are affected by all oxidizing and reducing agents, not just acids and bases that influence pH measurement. In practice, ORP measures the ability of a lake or river to break down waste products, like contaminants and organic matter. When the ORP value is high, there is lots of oxygen present in the water.
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Scanning Auger Nanoprobe
PHI 710
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Simulation Software For Cyclic Voltammetry
Digisim
Cyclic voltammetry can readily provide qualitative information about the stability of the oxidation states and the electron transfer kinetics of a redox system. However, quantitative studies using cyclic voltammetry (e.g., mechanistic investigations) are more difficult and typically require the use of simulation software. A number of methods have been developed for the simulation of cyclic voltammograms. Of these methods, the fast implicit finite difference method has been shown to be the most efficient, stable, and accurate, and this method is used for the DigiSim simulation software from BASi®.
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Light Source
A light source essentially is an optical transmitter that is paired with an optical receiver, both of which are connected to electrically based devices or systems. So, the source converts electrons to photons and the detector converts photons to electrons.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Field Testing Equipment for 3 Phase Energy Meter
SY3002
Hong Kong Songyang Industrial Ltd.
The field-testing instrument SY3002 is made by using the newest international digital electron technical skill To use DSP processor, as the axis to install this intelligent comprehensive automation field-testing instrument, which comes with a portable computer, the 11.3" colorful display screen, and Chinese characters operation menu suggestion.
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Nuclear Magnetic Resonance Spectrometer
NMR
NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Counter Electrodes
For a system using a three-electrode potentiostat, we measured current when a potential is applied between the working electrode and the reference electrode. Passage of current through an electrical circuit requires electron transfer reaction between the working electrode and the counter electrode.The main function of the counter electrode is to provide the location of the second electron transfer reaction. Important parameter of the counter electrode is the surface area. It is required (area) large enough to support the current generated for the working electrode. For example, the surface area of the platinum electrode of 5 cm is sufficient to use as an electrode, such as steady-state cyclic voltammetry experiments. However, for generating a high current measurements such as bulk electrolysis, the counter electrode of a larger area is required, as Catalog No.012961 which the length of platinum is 23 cm. This electrode is used for measurement, such as rotating ring disk.
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Cryo-Correlative Microscopy Stage
CMS196
Linkham Scientific Instruments
Electron microscopy (EM) provides structural information at very high resolution. However, it can give only restricted insight into biological and chemical processes due to limitations in staining and sample preparation processes. Fluorescence microscopy on the other hand is a very sensitive method to detect biological, chemical and genetic processes and events inside living cells. Cryo-CLEM brings it all together: it is a new and emerging technique to combine the individual advantages from both Fluorescence and EM by imaging the same sample location with both techniques and superimposing the complementing information.
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Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Gunn Diodes
The Gunn diode is the best known and most readily available device in the family of transferred electron devices (TED). They are employed as DC to microwave converters using the negative resistance characteristics of bulk Gallium Arsenide (GaAs) and only require a standard, low impedance, constant voltage power supply, thereby eliminating complex circuitry. Teledyne Lincoln Microwave’s DC1200 series of GaAs Gunn diodes is designed for operation at fixed frequency (determined by the oscillator cavity) within a specified band under CW or pulsed conditions.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Magnetic Field Cancelling System
MR-3
3-axis magnetic field cancelling system for electron microscopes (SEM and TEM), electron and ion beam experiments, nanotechnology, biomagnetic investigations, etc. High reliability through rugged analog design. No tedious programming, no chrashs. More than 1000 MR-3 systems sold worldwide.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Microscopy
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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Scanning Electron Microscope w/ EDX Laboratory
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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PIN Photodiode
PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates with an applied reverse bias voltage and when the reverse bias is applied, the space charge region must cover the intrinsic region completely. Electron hole pairs are generated in the space charge region by photon absorption. The switching speed of frequency response of photo diode is inversely proportional to the life time. The switching speed can be enhanced by a small minority carrier lifetime. For the photo detector applications where the speed of response is important, the depletion region width should be made as large as possible for small minority carrier lifetime as a result the switch speed also increases.
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Electron Beam Lithography System
Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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A Highly Versatile R&D Bell Jar Thin Film Coating System.
MODEL VES-3000
TEK-VAC's VES-3000 coater station model offers a modular concept for thin film deposition. Common PVD techniques which can be employed in this compact unit include thermal and electron beam evaporation. A 2KVA SCR controlled filament evaporation power supply is provided. Optional ion deposition and magnetron sputtering devices can be incorporated in the system.
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Segmented STEM Detector
Opal
In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscopes (STEM) which can support multiple applications such as DPC, cryo tomography, imaging of strain, charge, light elements or Z-contrast.
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Space Flight Components
A tec, Inc. specializes in the design, manufacture, and integration of complex test systems and quality critical components. Our production engineering expertise separates us from other manufacturing companies when both reliability and cost are important. Atec has the best in 5 to 9 Axis CNC machining, coordinate measuring machines (CMMs), 3D additive metal and plastic printers, 9-Axis capable waterjet, cryogenic liquid flow test benches and environmental test chambers. We can deliver to the tightest tolerances and most exacting requirements. We can advise our customers on electron beam welding, friction joining, electronic test, environmental test, acoustics, vibration and many other technologies that can reduce manufacturing and operating costs. We are currently manufacturing liquid rocket engine fuel and oxidizer valves for multiple launch vehicles and have participated in 158 consecutive launch successes. Atec manufactured and tested advanced lithium-ion battery adapter plates that manage power for the International Space Station. Atec is designing, manufacturing, and testing power flow modules that work to prevent system failure on the human crew capsule (CCTS) that will transport astronauts to/from the ISS. Atec was awarded NASA Agency-Level Small Business Subcontractor of the Year , SBA Region VI Subcontractor of the Year for our support to NASA and Boeing and we were named a DCMA Top 500 Supplier.
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Metrology/SEM
Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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