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Discrete Component Testers
check connected individual semiconductor components.
- Dynalab Test Systems, Inc.
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Hipot Tester
NX Hipot+
50 to 1500VDC Hipot Testing, 50 to 1000VAC (optional), Expandable to 1024 test points, 5Mohm to 1Gohm Insulation Resistance, Simple 4-button user interface, Tests for continuity and shorts, Tests a variety of components, Precision resistance measurements, Continuous high speed scanning for real time complete status information of harness assembly progress, Keyed security access and control, Built for rough industrial environments, 2 serial ports for connection to printers and scanners, Standalone operation, Uses a high capacity memory card, Available from 64 to 1024 test points, Networkable
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Impact Series Power Discrete Semiconductor Tester
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Benchtop Discrete Component Tester
Imapact 7BT
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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ABex PXI to Analog Bus Bridge with Digital IOs
ABex AM-300 Controller
The ABex system controller ABex AM-300 is required to control the analog bus of a ABex chassis. It is used as an interconnection bridge between PXI and ABex backplane.In addition it features a whole bunch of additional functionality. Despite the 96 open drain outputs it has galvanically isolated IOs, and communication interfaces.
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Passive Component Integration - PXIe
Passive Series
The Passive PXIe module is a highly customizable PXIe module that can integrate the passive components of your choice.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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Passive Component Integration - MATRIQ
The Passive is a highly customizable benchtop accessory that can integrate the passive components of your choice for convenient storage and integration into your test set up.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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Passive Component Integration
Integrate passive optical components of your choice such as WDM couplers, splitters, band-pass filters, PM beamsplitters and circulators. PXIe and benchtop models support SMF, MMF and PMF.
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Automated Coherent Receiver Tester
CoRx Tester.
Quantifi Photonics’ CoRx Tester provides automated measurement of key coherent receiver performance parameters. The CoRx Tester is comprised of a pre-configured PXI chassis, a two-channel tunable laser, a polarization controller, and a two-channel Variable Optical Attenuator (VOA) with built-in power meter. Just connect the two optical outputs to your Integrated Coherent Receiver (ICR), connect your ICR to the oscilloscope and let the CoRx Tester software do all the rest.
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PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Bit Error Rate Tester - PXI
BERT 1001/1005 Series
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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MTM-Bus Tester
PXIe-1149.5
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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KVS Rugged Igniter Tester With Current Monitor
4314
The Valhalla Scientific Model 4314 KVS Digital Igniter Tester is designed to provide extremely safe and reliable resistance testing of explosive or volatile devices. Proven uses include fuses, squibs, igniters, explosive bolts, automobile airbag initiators and many others.
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PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Component Testers
Unlike other handheld instruments such as LCR meters that make measurements using an AC signal with a specific test frequency, the 830C measures capacitance by applying a constant current that briefly charges, then discharges the connected capacitor.
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Discrete Detectors
TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.
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System Components
System components and accessories complete the Bender product portfolio:Coupling devices for ground-fault monitoring at high voltages, analog measuring instruments, power supply units, interface converters and interface repeaters.Please contact us for advice regarding these and other system components.
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Components
The Brooks field-proven wafer transport robots and modules deliver high performance and low total cost of ownership to create manufacturing efficiency, accelerate innovation, and drive profits for today’s manufacturers.
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Measurement Components
Rosenberger Hochfrequenztechnik GmbH & Co. KG
Innovative developments and modern electronic applications to support everyday life require the use of ever higher frequencies – this applies to specialized areas such as aerospace technology and automotive as well as to the increasing bandwidth requirements in communications technology.
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LCR & Component Tester
PeakTech Prüf- und Messtechnik GmbH
Digital LCR measuring device for resistance, capacitance and inductance with high-resolution dual multifunction display. Components can be measured in series or in parallel and the LCR meter also offers the choice between automatic and manual range selection.
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Smartchem Discrete Analyzers
Fully automated, multi-parameter, direct read discrete analyzers, available in bench-top or floor-stand models, for simple and automated chemistries. Up to 200 samples and up to 600 tests/hour.
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Coaxial Components
Surge arrestors are designed to protect wireless base stations, switching centers and transmission lines fromthe damaging effects of extreme high voltage surges caused by lightning strikes. The RFS lightning protectiondevices are designed and tested to the most demanding specifications. They are rated to protect against bothdirect and indirect multiple strikes in the harshest environments imaginable. Their rugged construction utilizes solid metal housing, and superior plating, which results in outstanding system protection and operatingcontinuity.
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Switching Components
Designed to minimize layout restrictions and maximize ease of operation, Omron’s innovative switching components make manufacturing flexibility more attainable than ever.
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X-Ray Components
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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Broadcast Components
Cable testing sections may be used to isolate the antenna inputs from the main feeder when testing either the antenna or feeder. These devices are normally installed between the main feeder cable and antenna inputconnector and allow access to the antenna input without the need to remove the main feeder cable. Cable test sections are particularly useful with large feeder cables that are difficult to manoeuvre.
