Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States
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Conformance Calibration Standard Test Card for ISO/IEC Data Matrix and GS1 DataMatrix Symbol Verifiers
AI-CCS-DM-G Rev A
This precision 2D barcode Conformance Calibration Standard Test Card is the first 2D test card to provide ALL 12 of the Primary Reference Symbols specified by ISO 15426-2 for barcode verifiers. They are sized from 0.5mm to 0.2mm so that all the symbol sizes specified in Annex A.3.1 can be tested. Symbols 1-4 are GS1 DataMatrix symbols, while symbols 5-12 are ISO/IEC Data Matrix symbols consistent with the ISO/IEC 16022 standard. The card also includes four calibrated reflectance patches.
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Image Analysis Micrometers
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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ACCUplace Dot Distortion Target
AP-DD Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Distortion target is designed to detect the presence of both barrel/pincushion distortion as well as alignment distortion that causes the keystone effect. The precise amount of distortion is determined from an array of precisely placed dots in a regular array. The results can be used to correct for any distortion that occurs within the optical system. The AP-DD is offered on three standard substrates; Chrome on Glass (CG) Opal (OP) and Photo Paper (RM).
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Reticles / Graticules
With over 30 years experience in the manufacturing of high precision Custom and Standard Reticles for a wide range of applications, APPLIED IMAGE has gained a reputation for delivering precision and accuracy parts on time. Using our state of the art technology, our components are the most precise in the industry. Applications of this technology is useful in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Optical Apertures
The APPLIED IMAGE Optical Aperture reticles are available in sizes from 10μm (0.01mm) to 1,000μm (1.0mm) center openings (noted by -10, -25, -30 etc.), on either Chrome on Glass or Chrome on Opal material, with an overall size of 25.4mm (1.0 inch) diameter.
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SINE M-15-60 Sinusoidal Array
The reflective Sinusoidal Array SINE M-15-60 is similar to the M-13-60 (1X version) except that the range of spatial frequencies begins with 0.25 cycles per mm and extends to 20 cycles per mm. To compensate for the additional frequencies, the 3/16 cycles per mm area has been eliminated. Both arrays are imaged on Photo Paper.
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SINE FBI Charts
There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.
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O.E.M. Specific Test Charts
O.E.M. Specific Test Charts by Applied Image - IMATEST SFRPlus Chart, ISA ColorGauge Targets, ISA Device Level Target, ISA Object-Level Target Family, ISA Spatial Frequency Response Target
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EIA Test Charts
EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers
AI-CCS-UPC/EAN-E Rev S
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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Conformance Calibration Standard Test Card for GS1-DataBar Symbol Verifiers
AI-CCS-DATABAR
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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NBS Targets
NBS Targets by Applied Image - NBS-1952 Resolution Test Chart, ANSI/ISEA Z87.1-2020 Test Resolution Standard
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PhotoMASK Services
For years APPLIED IMAGE has been serving customers who work with semiconductors, displays, PCB, MEMS, along with college professors, researchers, and students with Photomask making solutions tailored specifically to each customer’s needs. Working with a dedicated sales engineer means that you will have all of your questions answered.
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ACCUplace Position Grid
AP-P Series
The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).
