Advantest Corp.
Automated Testing Equipment (ATE) verify the quality, performance and reliability of semiconductors by electrically testing these complex and multifarious functions of semiconductors with high accuracy. The automated testing technologies from Advantest at the top of the industry are contributing to higher efficiency in production on customer sites, technological innovations of the electronics industry, and greater safety, security and comfort for society.
- +81-3-3214-7500
- +81-3-3214-7712
- webmaster@advantest.com
- Shin Marunouchi Center Bldg.
1-6-2, Marunouchi, Chiyoda-ku,
Tokyo, 100-0005
Japan
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product
Terahertz Spectroscopic System
TAS7400
The TAS7400 product line offers a series of low-cost, all-purpose spectroscopic systems that enable spectroscopic measurements using terahertz (THz) waves. The tools are capable of performing non-destructive analysis on a wide variety of sample types, making it applicable to a broad range of fields from life sciences to electronics, where precise chemical and material characterization is critical. The systems are ideal for settings ranging from basic research to product development, as well as for manufacturing and quality control, and employ easy-to-use spectroscopic methods that do not require specialized knowledge of THz wave generation or optics.
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product
Terahertz Spectroscopic Analysis System
TAS7500SL
Research in the area of materials for terahertz wireless communications, etc. 0.03-2THz frequency range is optimized for research in the area of materials for terahertz wireless communications, etc. Easy module switching requires no adjustments Attached dry air unit eliminates moisture interference
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product
Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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product
MASK MVM-SEM® E3600 Series
E3650
Amid the progress of multiple-exposure technology, and the development of finer-pitch and more complicated circuits, as well as increases in the number of masks and the number of measurement points on each mask, the size of wiring patterns formed on photomasks needs to be measured and evaluated stably with high precision. Advantest’s E3600 series meets the needs of state-of-the-art devices with high measurement repeatability and stable throughput.
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product
Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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product
Terahertz Spectroscopic Analysis System
TAS7500SU
Wideband spectroscopic analysis in the terahertz frequency range A newly developed Cherenkov terahertz source delivers dramatically improved high-frequency capabilities, supporting spectroscopic measurement up to 7THz Highly stable spectral power is ideal for terahertz research Supports measurement of pharmaceuticals in liquid, solid, and powder forms Easy module switching requires no adjustments Attached dry air unit eliminates moisture interference
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product
Memory Burn-in Tester
B6700 Series
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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product
Memory Test System
T5511
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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product
SoC Test System
V93000 SoC / Smart Scale
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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product
Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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product
Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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product
Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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product
Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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product
Terahertz Systems
Terahertz waves are electromagnetic waves in the frequency band between radio waves and light waves. It combines the transmissivity of radio waves and the straightness of light waves and provides fingerprint spectra based on intermolecular interactions from small molecules to high polymers. By utilizing of this characteristic for spectroscopic and imaging measurements, it is possible to apply them to nondestructive analysis that has never been done before.
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W2BI Inc.
W2BI envisages an optimized user experience of seamless communication between an array of wireless devices defined by adaptability, inclusivity and independence. We envision W2BI as being the global forerunner in shaping this interoperability within the automated wireless industry. A member of the Advantest Group
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Cloud Testing Service, Inc.
CloudTesting™ Service leverages recent advances in cloud computing that have transformed the concept of ownership from physical possession of an asset to a licensing agreement, with the asset itself residing in the cloud. Applying this paradigm to semiconductor test, we built a business model that expands customer access to testers by delivering test IP directly to their personal computers.
